All Products of Material Characterisation

BI-MwA Molecular Weight Analyzer

BI-MwA Molecular Weight Analyzer

The BI-MwA Molecular Weight Analyzer is simple to use, but incorporates sophisticated features. Inject your sample into the low-volume, 7-angle flow cell. The sample is illuminated by a temperature stabilized, precision power-cont...
BI-ZTU Autotitrator

BI-ZTU Autotitrator

The BI-ZTU, autotitrator option for the NanoBrook zeta potential analyzers is ideal for automatic determination of the isoelectric point, the IEP, of colloidal materials. Four pumps provide unparalled flexibility for optimizing re...
BI-DCP Particle Size Analyzer Disc Centrifuge

BI-DCP Particle Size Analyzer Disc Centrifuge

The Brookhaven BI-DCP is a digitally controlled, high resolution, particle size distribution analyzer. It yields high resolution results in the size range from 0.01 to 30 microns with typical analysis times ranging from 5 to 30 mi...
BI-200SM Research Goniometer and Laser Light Scattering System

BI-200SM Research Goniometer and Laser Light Scattering System

With a Brookhaven Instruments BI-200SM Research Goniometer System this rich field of exploration is open to you for studies of both Static Light Scattering (SLS) and Dynamic Light Scattering (DLS).
NanoBrook Omni Particle Size and Zeta Potential Analyzer with Microrheology

NanoBrook Omni Particle Size and Zeta Potential Analyzer with Microrheology

Brookhaven's NanoBrook Omni instrument combines the best technology from our particle/protein sizer and zeta potential analyzer in to one powerful and accurate solution for sizing and zeta potential analysis. Measure samples in ne...
TF Lab 4040 - Non-contact Sheet Resistivity Meter

TF Lab 4040 - Non-contact Sheet Resistivity Meter

The EddyCus TF lab 4040 is dedicated to non-contact single point sheet resistance measurement of larger substrates. The flexibly applicable bench-top device allows precise manual sheet resistance measurement of conductive thin fil...
The MProbe 40: MSP  Thin Film Measurement System

The MProbe 40: MSP Thin Film Measurement System

he MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select…
The MProbe 20 Series: Thin Film Thickness Measurement System

The MProbe 20 Series: Thin Film Thickness Measurement System

The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affo...
Allalin 4027 Chronos - Quantitative Cathodoluminescence

Allalin 4027 Chronos - Quantitative Cathodoluminescence

The Allalin 4027 Chronos is the first dedicated cathodoluminescence solution offering a 10 picoseconds time resolution mode.
Grammont 2172 - Nanometer Resolution Spectroscopy Instrument

Grammont 2172 - Nanometer Resolution Spectroscopy Instrument

The Grammont 2172 is a nanometer resolution spectroscopy instrument, based on a disruptive technology called Quantitative Cathodoluminescence, that tightly integrates a scanning electron microscope and a light microscope into one ...
LZT-Meter  - Seeback Coefficient & Electric Resistivity Unit

LZT-Meter - Seeback Coefficient & Electric Resistivity Unit

The first commercial instrument worldwide to measure the Figure of Merit in only one measurement (combining LSR and LFA).
  LFA 1000 Laser Flash Apparatus

LFA 1000 Laser Flash Apparatus

The Linseis LFA 1000 Laser Flash is the most modular and precise Instrument for the determination of Thermal Diffusivity, Conductivity and Specific Heat Values. Its sample robot for up to 6 Samples at the same time allows unbeaten...
STA PT1600  -STA Simultaneous Thermal Analysis

STA PT1600 -STA Simultaneous Thermal Analysis

The STA PT1600 is the high end Simultaneous Thermobalance from LINSEIS. The system offers unparalleled TG and DSC resolution in combination with the highest vacuum capabilities and TG drift stability. The system is modular with ma...
Phenom ProX - Scanning Electron Microscope (SEM)

Phenom ProX - Scanning Electron Microscope (SEM)

The Phenom ProX desktop scanning electron microscope (SEM) is the ultimate all-in-one imaging and X-ray analysis system. With the Phenom ProX , sample structures can be physically examined and their elemental composition determine...
Phenom Pro- Scanning Electron Microscope

Phenom Pro- Scanning Electron Microscope

The Phenom Pro is Phenom-World's high-end imaging desktop SEM. In combination with a large range of sample holders and automated system software, it can be tailored to suit a multitude of applications.
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Material Science & Nanotechnology