Material Characterisation - Semiconsoft

The MProbe 20 Series: Thin Film Thickness Measurement System

The MProbe 20 Series: Thin Film Thickness Measurement System

The MProbe 20 series is a desktop system for thin-film thickness measurement. The measurement is based on spectroscopic reflectance and uses fiber optics retro-reflecting probe. This approach yields a compact, easy to use and affo...
The MProbe 40: MSP  Thin Film Measurement System

The MProbe 40: MSP Thin Film Measurement System

he MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select…
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    Material Science & Nanotechnology