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General
Dielectric Analyzer
DEA - Dielectric Analyzer
Dielectric cure monitoring measures electrical properties to determine the cure state and viscosity of thermoset materials, at the same time providing insight into chemistry, reaction rate, formulation and physical parameters.
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Material Science & Nanotechnology
- Surface Treatment
- Battery Test System
- Portable Solar Simulator
- Solar Simulator
- Electrochemical Workstation
- 4-quadrant Power Potentiostat
- Dual Syringe Infusion / Withdrawal Syringe Pump
- Continuous Flow Syringe Pump
- Fuel Cell Membrance Coating System
- Ultrasonic Coating System
- Electrolyzer Coating System
- Picoliter Syringe Pump
- Stereotaxic Syringe Pump
- OEM Syringe Pump
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- Glovebox
- Hall Effect
- Syringe Pump
- Thermal Analyzer
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- Oven
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- Air Circulation Furnace
- Annealing, Hardening and Brazing Furnace
- Tube Furnace
- Rotary Vane Vacuum Pumps
- Weighing Furnace
- High-temperature furnace
- Dry Scroll Pump
- Heat Flow Meter
- Transient Hot Bridge
- Differential Thermal Analyzer
- Dielectric Analyzer
- Evolved Gas Analysis
- Gas Dosing System
- Hardness Tester
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- Sputter System
- Slot Die Coating System
- Spin Coater
- Wafer Cleaner
- PECVD System
- RIE System
- Thermal Evaporation System
- Modulated Speed Rotator
- Precision Cutter
- Mounting Press
- Grinder & Polisher
- Laboratory Electrospinning Equipment
- Nanofiber Equipment
- Full-Wafer Thermal Nanomprintor
- Full-Wafer Imprintor with Alignment and Photolithography
- UV/Ozone Cleaner
- Mask Aligner
- Parylene Coater
- Pipette
- Fuel Cell Membrance Coating System
- Carbon Nanotubes, Nanowires, and Graphene
- Sensor Coating System
- Photoresist and Polyimide Coating System
- EMI Shielding Coating System
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- Atomic Force Microscope
- Scanning Electron Microscope (SEM)
- Simultaneous Thermal Analyser
- Laser Flash Apparatus
- Seeback Coefficient & Electric Resistivity Unit
- Molecular Weight Analyser
- Research Goniometer and Laser Light Scattering System
- Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
- Hybridized SEM – Spectroscopic Platform (FA CL SEM)
- Thin Film Thickness Measurement System
- Microscope Thin Films Measurement System
- Non-contact Sheet Resistivity Meter
- Particle Size and Zeta Potential Analyzer
- BI-DCP Particle Size Analyzer
- Solar Simulators
- SMU Systems
- Active Loads
- Sample Holders
- CalCell
- LBIC
- Sheet Resistance Tester
- Sheet Resistance Mapper
- Sheet Resistance Inline Systems
- Spectrophotometer
- Densitometer
- Industrial/Online Colour Measurement
- Software
- Thermal Interface Material Tester
- Thin Film Analyzer
- Thermoelectrics
- Gravimetric Sorption Analyzer
- Dipping Probes
- Imaging Ellipsometer
- Active Vibration Isolation System
- Flow Imaging Microscopy
- AFM Image Analytics Software
- Nanoscale Infrared Spectroscopy
- Photomask Repair System
- Light Collection / Injection for STEM (CL STEM Add-On)
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