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Material Characterisation
Microscope Thin Films Measurement System
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The MProbe 40: MSP Thin Film Measurement System
he MProbe 40 is a complete thin-film measurement system. Select the model and options the fit best for your application requirements or let us know your application and we will help to select…
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Material Science & Nanotechnology
- Surface Treatment
- Battery Test System
- Portable Solar Simulator
- Solar Simulator
- Electrochemical Workstation
- 4-quadrant Power Potentiostat
- Dual Syringe Infusion / Withdrawal Syringe Pump
- Continuous Flow Syringe Pump
- Fuel Cell Membrance Coating System
- Ultrasonic Coating System
- Electrolyzer Coating System
- Picoliter Syringe Pump
- Stereotaxic Syringe Pump
- OEM Syringe Pump
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- Glovebox
- Hall Effect
- Syringe Pump
- Thermal Analyzer
- Nitrogen Dry Glovebox
- Controlled Atmosphere/Anaerobic Chamber
- Oven
- Ashing Furnace
- Muffle Furnace
- Air Circulation Furnace
- Annealing, Hardening and Brazing Furnace
- Tube Furnace
- Rotary Vane Vacuum Pumps
- Weighing Furnace
- High-temperature furnace
- Dry Scroll Pump
- Heat Flow Meter
- Transient Hot Bridge
- Differential Thermal Analyzer
- Dielectric Analyzer
- Evolved Gas Analysis
- Gas Dosing System
- Hardness Tester
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- Sputter System
- Slot Die Coating System
- Spin Coater
- Wafer Cleaner
- PECVD System
- RIE System
- Thermal Evaporation System
- Modulated Speed Rotator
- Precision Cutter
- Mounting Press
- Grinder & Polisher
- Laboratory Electrospinning Equipment
- Nanofiber Equipment
- Full-Wafer Thermal Nanomprintor
- Full-Wafer Imprintor with Alignment and Photolithography
- UV/Ozone Cleaner
- Mask Aligner
- Parylene Coater
- Pipette
- Fuel Cell Membrance Coating System
- Carbon Nanotubes, Nanowires, and Graphene
- Sensor Coating System
- Photoresist and Polyimide Coating System
- EMI Shielding Coating System
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- Atomic Force Microscope
- Scanning Electron Microscope (SEM)
- Simultaneous Thermal Analyser
- Laser Flash Apparatus
- Seeback Coefficient & Electric Resistivity Unit
- Molecular Weight Analyser
- Research Goniometer and Laser Light Scattering System
- Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
- Hybridized SEM – Spectroscopic Platform (FA CL SEM)
- Thin Film Thickness Measurement System
- Microscope Thin Films Measurement System
- Non-contact Sheet Resistivity Meter
- Particle Size and Zeta Potential Analyzer
- BI-DCP Particle Size Analyzer
- Solar Simulators
- SMU Systems
- Active Loads
- Sample Holders
- CalCell
- LBIC
- Sheet Resistance Tester
- Sheet Resistance Mapper
- Sheet Resistance Inline Systems
- Spectrophotometer
- Densitometer
- Industrial/Online Colour Measurement
- Software
- Thermal Interface Material Tester
- Thin Film Analyzer
- Thermoelectrics
- Gravimetric Sorption Analyzer
- Dipping Probes
- Imaging Ellipsometer
- Active Vibration Isolation System
- Flow Imaging Microscopy
- AFM Image Analytics Software
- Nanoscale Infrared Spectroscopy
- Photomask Repair System
- Light Collection / Injection for STEM (CL STEM Add-On)
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