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Spectrophotometers (UV-Vis/NIR, FL)

EEM® View -CMOS camera imaging system for Fluorescence Spectrophotometer-

EEM® View -CMOS camera imaging system for Fluorescence Spectrophotometer-

EEM View is a completely new concept system in the world which delivers fluorescence, reflection spectra and these images simultaneously. To make it possible, AI technology is applied to analyze data with a special algorithm*1. This measurement is possible by installing the EEM View Accessory on the F-7000 / 7100 Fluorescent Spectrophotometer. *1 The spectral analysis algorithm was developed in joint research by Professor Imari SATO and Associate Professor Yinqiang ZHENG of the National Institute of Informatics. * "EEM" is a trademark of Hitachi High-Tech Science Corporation, registered in Japan and China.
Brand: Hitachi High-Tech Available
Free delivery within Singapore only