M4 TORNADO PLUS micro-XRF Spectrometer

Carbon Lowest detectable element: All elements starting from carbon can be measured

0.5-4.5mm Selectable collimator sizes: Four-position collimator changer on the additional tube

>6mm Depth of focus with AMS: The aperture management system (AMS) allows a sharp image on topographic samples

The Revolutionary Super-Light Element micro-XRF Scanner

With the newest model of Bruker's micro-XRF family, you can find out more about your sample than XRF ever showed you before.

With its super-light element detectors, the M4 TORNADO PLUS is the first micro-XRF scanner able to measure any element from carbon upwards. Additionally, the performance of all light elements is strongly increased.  

On this instrument, Bruker introduced the patented aperture management system (AMS) that enhances the depth of focus of the polycapillary lens for sharper element mappings of uneven samples. The optional second X-ray source further extends the analytical capabilities with its four selectable spot sizes from 0.5 to 4.5 mm.

Lighter, Faster, Deeper.

The chamber of the M4 TORNADO family offers an option for He-flush. This increases the light-element performance while maintaining atmospheric pressure in the chamber. Light elements in biological or wet specimens can be analyzed without the need to freeze or dry the samples.

Benefit from the PLUS in Analytical Performance

• Measure solids, particles or liquids with all advantages the well-proven M4 TORNADO family has to offer
• Extend your micro-XRF experience with the ability to record spectra, line scans and maps of the complete element range starting at carbon
• Record and save a combination of optical image and full spectral information per pixel in a HyperMap data cube
• Reduce your measurement time through the combination of the focused X-ray beam with two high-throughput super-light element SD detectors
• Get fast quantification results with a configurable fundamental parameter routine or use Bruker's XMethod software for standard-supported, fully standard-based and layer thickness quantification
• Map uneven samples at high depth of focus using the aperture management system (AMS)
• Improve performance with upgrades and service packages throughout the whole lifetime of the instrument