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Atomic Force Microscope

NP-AFM - Atomic Force Microscope

NP-AFM - Atomic Force Microscope

The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
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Features

 

High Resolution Video Microscope Readily locate Features for Scanning
Multiple Sample Stage or Vacuum Chuck Optimized for specific technical samples
Closed Loop XY scanner Great accuracy with rapid zoom to feature
Probe Exchange Tool Reduce time for probe exchange
In plane flexure XY scanner Minimal out of plane motion in images
Labview software with USB communication Readily adaptable to new operating systems
Uses Industry standard probes Probes for specific measurements are readily available.
Includes Vibrating, Non-Vibrating modes Turnkey system
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