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Atomic Force Microscope

SA-AFM - Atomic Force Microscope

SA-AFM - Atomic Force Microscope

The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated with inverted microscopes.
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Free delivery within Singapore only

Features

 

Open Frame Design Any sized sample can be scanned
Includes bottom plate Allows for scanning small samples
Probe Exchange Tool Included Reduce time for probe exchange
Includes top view video microscope Facilitates tip approach and laser alignment
Includes vibrating, non-vibrating, phase, LFM, and advanced F/D Most common scanning modes included for many applications
Flexible Sample holder Can be used with most commercially available probes
Labview software with USB communication Readily adaptable to new operating systems
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