UV-Visible/NIR Spectrophotometer UH4150

Features

Small signal level differences at detector switching afford highly accurate measurements even when the wavelength of detector is being switched.

Multiple detectors are installed in the integrating sphere to perform measurement over a wide range of wavelengths, from ultraviolet to visible to near infrared regions. The changes in photometric values at detector switching (from signal level differences) are minimized due to a design utilizing Hitachi’s expertise in integrating sphere construction, signal processing technologies, etc.

Example of Measured Data around the Wavelength of Detector Switching (Absorption spectrum of Gold Nanorods)

Low stray light and low polarization characteristics are attained with Hitachi’s high-performance prism-grating double monochromator system.

The UH4150 adopts a prism-grating (P-G) double monochromator optical system, continuing the established reputation of the U-4100 optical system. Large changes in light intensity of the S and P polarization are less likely for the prism-grating (P-G) system than for the generally used grating-grating (G-G) system. The UH4150 offers low noise measurements, even for low transmittance and reflectance samples.

Collimated light beam allows accurate measurement of reflected light and scattered light.

The incident angle is important for the measurement of specular reflectance of solid samples. For focused light beam, the incident angle varies depending on the lens’s focal length, etc. Consequently, the values of simulation of design of optical thin films, such as dielectric multilayer film and prism, would differ from actual measured values. In the case of a collimated light beam, however, the incident angle is always the same with respect to the sample, leading to a highly accurate measurement of specular reflectance. Moreover, the collimated light beam is useful for the evaluation of diffusivity (haze) and the measurement of transmittance of lenses.

Specular Reflectance measurement example

A wide variety of detectors affords the selection of detectors suitable for measurement objectives.

Eight types of integrating spheres of different materials, sizes, and shapes are available.^*2*3

Lineup of Detectors

New ergonomic design has been adopted.

The door of sample compartment is modified to improve the operation. An ergonomic design is adopted by taking into account the operation of replacing samples and accessories.

Compatible with many of the U-4100 accessories.

Common accessories are available for both models. Accessories used with Model U-4100 can also be used with Model UH4150^*4. Since the accessories are removable, they help to accommodate a wider range of measurement types.

Higher throughput than Model U-4100.

While maintaining the high-performing optical system of the model U-4100, the UH4150 provides higher throughput measurements. In the previous model, a scan speed of 600 mm/min was necessary for a measurement using a data interval of 1 nm. With Model UH4150, you can measure at 1 nm intervals while using a scan speed of 1,200 nm/min, reducing the measurement time significantly.*⁵ The UH4150 measures from 240 to 2,600 nm in approximately two minutes. It is effective for samples requiring measurement in UV-VIS-NIR wavelength range, such as Solar Reflective Materials.

Reflectance Spectrum of Solar Reflective Material using Scan Speed of 600 nm/min

Reflectance Spectrum of Solar Reflective material using Scan Speed of 1,200 nm/min

Automatic Measurement System

We have taken three popular peripheral systems for the UH4150 spectrophotometer—the automatic variable-angle absolute reflectance measurement system, the automatic polarization measurement systems, and 5 Degrees reflectance/transmittance measurement system with automatic X-Y stage—and converted them into standalone systems that can be purchased individually.

System Lineup

Integrating Sphere Detection System

A variety of 60 mm integrating spheres are available. As optional items, we offer 150 mm integrating spheres or Continuously Variable Angle Absolute Reflectance accessories (60 mm standard integrating sphere is shown here).

Direct Light Detection System

The direct light detector is built in the spectrophotometer. The direct light detector can be replaced with other optional detectors, such as various Integrating Spheres and Continuously Variable Angle Absolute Reflectance accessories.

Example of application

Transmittance Measurement of Micro Samples

The transmittance measurement accessory for micro samples supports the transmission measurement of samples such as micro glass pieces and pickup lenses.

Measurement Example of Pickup Lenses

Transmittance Measurement System for Micro Samples (P/N 1J0-0204)

*It is necessary to replace the light source mask with the supplied φ4-mm light source mask.

Diffuse Reflectance Measurement

Diffuse reflectance measurement of powder samples, etc. is possible by placing the sample behind the integrating sphere (sample side incident angle of 0°).

Example of Diffuse Reflectance Measurement of Titanium (IV) Oxide

60 mm Standard Integrating Sphere (for both total reflectance and diffuse reflectance) (P/N 1J1-0120)

Optical Thin-Film Industry

The Optical Thin-Film is an essential technology for optical components such as camera, lens of glasses, projector and mirror.
The accurate evaluation of optical characteristics is becoming more and more important for advanced development and quality control of optical components.