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Material Science & Nanotechnology
All Products of Material Characterisation
STA MSB PT 1 - Magnetic Suspension Balance
With the magnetic suspension balance LINSEIS MSB PT 1, gravimetric measurements in a wide temperature and pressure range and under aggressive media can be done. The contact-less transmission of the sample weight is realized with a...
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STA HP 3 (high pressure TG-DSC) - Table version
Linseis introduced the all new STA HP 3 (TGA+DSC) table top high pressure thermogravimetric, simultaneous thermal analysis instrument. The STA HP 3 is the result of 25 years of experience thermal analysis under high pressure. The ...
High Pressure STA HP 1/2
The LINSEIS High Pressure STA ( High pressure Tg-DSC) delivers unsurpassed performance. The system can be used to determine simultaneous changes of mass (TG) and caloric reactions (HDSC) under defined atmosphere and high pressure ...
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Linseis TA Software for Thermal Analysis
Linseis TA software is a powerful and easy-to-use software package that supports you in your daily work as well as in complex thermoanalytical investigations. It is specially designed for Linseis instruments and opens up a wide ra...
Phenom Pharos G2 Desktop FEG-SEM
Tabletop field emission gun scanning electron microscope for high quality imaging across disciplines.
Park NX12 - Atomic Force Microscope
A versatile microscopy platform for analytical chemistry researchers and shared user facilities
Mönch - Light Collection / Injection for STEM
Cathodoluminescence – Photoluminescence –
Thermo-emission – Compatiblity with EELS, EDS…
Allalin - Hybridized SEM - Spectroscopic Platform
SEM – Cathodoluminescence – Photoluminescence
Spectroscopic Analysis – Pump & Probe
Electrical Measurements – Nanoprobes
Park NX10 - Atomic Force Microscope
The premiere choice for nanotechnology research
Park NX-Mask - Photomask Repair System
An AFM-based EUV Mask Repair and More
Park NX-IR - Nanoscale Infrared Spectroscopy
The Nanoscale Infrared Spectroscopy for Chemical Analysis and Material Imaging
Park SmartAnalysis - AFM Image Analytics Software
The Park AFM Image Analytics Software
FlowCam ALH - Automated Liquid Handling System
Automated Liquid Handling System
FlowCam + LO
Combines the FlowCam's patented flow imaging microscopy technology with an embedded light obscuration module to provide USP 787/788 compliance.
FlowCam Cyano
For particles from 2µ - 1mm. Automatically differentiate cyanobacteria from other algae.
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Material Science & Nanotechnology
- Surface Treatment
- Battery Test System
- Portable Solar Simulator
- Solar Simulator
- Electrochemical Workstation
- 4-quadrant Power Potentiostat
- Dual Syringe Infusion / Withdrawal Syringe Pump
- Continuous Flow Syringe Pump
- Fuel Cell Membrance Coating System
- Ultrasonic Coating System
- Electrolyzer Coating System
- Picoliter Syringe Pump
- Stereotaxic Syringe Pump
- OEM Syringe Pump
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- Glovebox
- Hall Effect
- Syringe Pump
- Thermal Analyzer
- Nitrogen Dry Glovebox
- Controlled Atmosphere/Anaerobic Chamber
- Oven
- Ashing Furnace
- Muffle Furnace
- Air Circulation Furnace
- Annealing, Hardening and Brazing Furnace
- Tube Furnace
- Rotary Vane Vacuum Pumps
- Weighing Furnace
- High-temperature furnace
- Dry Scroll Pump
- Heat Flow Meter
- Transient Hot Bridge
- Differential Thermal Analyzer
- Dielectric Analyzer
- Evolved Gas Analysis
- Gas Dosing System
- Hardness Tester
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- Sputter System
- Slot Die Coating System
- Spin Coater
- Wafer Cleaner
- PECVD System
- RIE System
- Thermal Evaporation System
- Modulated Speed Rotator
- Precision Cutter
- Mounting Press
- Grinder & Polisher
- Laboratory Electrospinning Equipment
- Nanofiber Equipment
- Full-Wafer Thermal Nanomprintor
- Full-Wafer Imprintor with Alignment and Photolithography
- UV/Ozone Cleaner
- Mask Aligner
- Parylene Coater
- Pipette
- Fuel Cell Membrance Coating System
- Carbon Nanotubes, Nanowires, and Graphene
- Sensor Coating System
- Photoresist and Polyimide Coating System
- EMI Shielding Coating System
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- Atomic Force Microscope
- Scanning Electron Microscope (SEM)
- Simultaneous Thermal Analyser
- Laser Flash Apparatus
- Seeback Coefficient & Electric Resistivity Unit
- Molecular Weight Analyser
- Research Goniometer and Laser Light Scattering System
- Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
- Hybridized SEM – Spectroscopic Platform (FA CL SEM)
- Thin Film Thickness Measurement System
- Microscope Thin Films Measurement System
- Non-contact Sheet Resistivity Meter
- Particle Size and Zeta Potential Analyzer
- BI-DCP Particle Size Analyzer
- Solar Simulators
- SMU Systems
- Active Loads
- Sample Holders
- CalCell
- LBIC
- Sheet Resistance Tester
- Sheet Resistance Mapper
- Sheet Resistance Inline Systems
- Spectrophotometer
- Densitometer
- Industrial/Online Colour Measurement
- Software
- Thermal Interface Material Tester
- Thin Film Analyzer
- Thermoelectrics
- Gravimetric Sorption Analyzer
- Dipping Probes
- Imaging Ellipsometer
- Active Vibration Isolation System
- Flow Imaging Microscopy
- AFM Image Analytics Software
- Nanoscale Infrared Spectroscopy
- Photomask Repair System
- Light Collection / Injection for STEM (CL STEM Add-On)
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