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Material Science & Nanotechnology
All Products of Material Characterisation
NanoBrook Omni Particle Size and Zeta Potential Analyzer with Microrheology
Brookhaven's NanoBrook Omni instrument combines the best technology from our particle/protein sizer and zeta potential analyzer in to one powerful and accurate solution for sizing and zeta potential analysis.
Park SmartAnalysis - AFM Image Analytics Software
The Park AFM Image Analytics Software
sph900 - Portable Spectrophotometer
The flexible solution – spectrophotometer with the best handling on the market
sph870 - Spectrophotometer
Simply high precision color measurement
Park FX40 - Atomic Force Microscope
Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX ...
ColorCube - Stationary Spectrophotometer
The simplest solution for the laboratory – with single button operation
sph xs1 - Portable Spectrophotometer
The ultra mobile compact solution – Easy Colour and 60° gloss measurement
ColorTube - Stationary Spectrophotometer
The High-End solution with unique features setting it apart from the rest
sph RG2 - Portable Spectrophotometer
Made from solid materials – Spectrophotometer with highest protection class
Park NX20 - Complete AFM System
Park NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your ...
Park NX-Wafer - Atomic Force Microscope
Fully automated AFM solution for defect imaging and analysis that improves defect review productivity by up to 1,000%
TT-AFM - Atomic Force Micrioscope
This compact, second generation tabletop Atomic Force Microscope has all the important features and benefits expected from a light lever AFM. The TT-2 AFM includes a stage, control electronics, probes, manuals, and a video microsc...
NP-AFM - Atomic Force Microscope
The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.
SA-AFM - Atomic Force Microscope
The SA-AFM is a flexible AFM for scanning all sizes and shapes of samples. A complete system for life sciences samples, large samples, routine scanning of technical samples, and nanotechnology research. The SA is easily integrated...
Phenom ProX G6 Desktop SEM
Desktop SEM with EDS capability for robust, effortless, and versatile elemental analysis
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Material Science & Nanotechnology
- Surface Treatment
- Battery Test System
- Portable Solar Simulator
- Solar Simulator
- Electrochemical Workstation
- 4-quadrant Power Potentiostat
- Dual Syringe Infusion / Withdrawal Syringe Pump
- Continuous Flow Syringe Pump
- Fuel Cell Membrance Coating System
- Ultrasonic Coating System
- Electrolyzer Coating System
- Picoliter Syringe Pump
- Stereotaxic Syringe Pump
- OEM Syringe Pump
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- Glovebox
- Hall Effect
- Syringe Pump
- Thermal Analyzer
- Nitrogen Dry Glovebox
- Controlled Atmosphere/Anaerobic Chamber
- Oven
- Ashing Furnace
- Muffle Furnace
- Air Circulation Furnace
- Annealing, Hardening and Brazing Furnace
- Tube Furnace
- Rotary Vane Vacuum Pumps
- Weighing Furnace
- High-temperature furnace
- Dry Scroll Pump
- Heat Flow Meter
- Transient Hot Bridge
- Differential Thermal Analyzer
- Dielectric Analyzer
- Evolved Gas Analysis
- Gas Dosing System
- Hardness Tester
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- Sputter System
- Slot Die Coating System
- Spin Coater
- Wafer Cleaner
- PECVD System
- RIE System
- Thermal Evaporation System
- Modulated Speed Rotator
- Precision Cutter
- Mounting Press
- Grinder & Polisher
- Laboratory Electrospinning Equipment
- Nanofiber Equipment
- Full-Wafer Thermal Nanomprintor
- Full-Wafer Imprintor with Alignment and Photolithography
- UV/Ozone Cleaner
- Mask Aligner
- Parylene Coater
- Pipette
- Fuel Cell Membrance Coating System
- Carbon Nanotubes, Nanowires, and Graphene
- Sensor Coating System
- Photoresist and Polyimide Coating System
- EMI Shielding Coating System
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- Atomic Force Microscope
- Scanning Electron Microscope (SEM)
- Simultaneous Thermal Analyser
- Laser Flash Apparatus
- Seeback Coefficient & Electric Resistivity Unit
- Molecular Weight Analyser
- Research Goniometer and Laser Light Scattering System
- Full Wafer Cathodoluminescence Microscope (Full Wafer CL SEM)
- Hybridized SEM – Spectroscopic Platform (FA CL SEM)
- Thin Film Thickness Measurement System
- Microscope Thin Films Measurement System
- Non-contact Sheet Resistivity Meter
- Particle Size and Zeta Potential Analyzer
- BI-DCP Particle Size Analyzer
- Solar Simulators
- SMU Systems
- Active Loads
- Sample Holders
- CalCell
- LBIC
- Sheet Resistance Tester
- Sheet Resistance Mapper
- Sheet Resistance Inline Systems
- Spectrophotometer
- Densitometer
- Industrial/Online Colour Measurement
- Software
- Thermal Interface Material Tester
- Thin Film Analyzer
- Thermoelectrics
- Gravimetric Sorption Analyzer
- Dipping Probes
- Imaging Ellipsometer
- Active Vibration Isolation System
- Flow Imaging Microscopy
- AFM Image Analytics Software
- Nanoscale Infrared Spectroscopy
- Photomask Repair System
- Light Collection / Injection for STEM (CL STEM Add-On)
- Tribometers
- Indentation and Scratch Testers
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